/PRNewswire/ — Park Systems Corp., the global leader in atomic force microscopy (AFM) solutions, today announced the launch of the NX1; a compact, powerful AFM that delivers atomic resolution images under ambient conditions. Developed in collaboration with Prof. Franz J. Giessibl of the University of Regensburg, one of the world’s leading experts in the field of atomic-resolution AFM microscopy, the NX1 brings a class of imaging performance previously only possible in ultra-high vacuum environments within the reach of research laboratories worldwide.
(Left to right) Prof. Franz J. Giessibl (University of Regensburg) and Dr. Sang-il Park (Founder & CEO, Park Systems)
The Park NX1 Atomic Force Microscope, designed for atomic-scale imaging in ambient conditions.
The NX1 is based on Orpheus II, a prototype developed by Prof. Giessibl’s Regensburg group, which has shown that atomically resolved images are possible under ambient conditions. Park Systems has translated this concept into a fully realized commercial product, combining the Orpheus II’s proven core architecture, including a Kovar package for exceptional thermal stability, with Park Systems’ precision manufacturing, product reliability and global AFM engineering expertise. The result is an instrument that has an order of magnitude lower noise floor than conventional AFM systems, making atomic-scale imaging accessible to everyday laboratory use.
“The NX1 is the result of combining Prof. Giessibl’s groundbreaking research with Park Systems’ proven ability to bring the world’s most advanced science to market,” said Dr. Sang–Joon Cho, executive vice president and head of research equipment business unit at Park Systems. “Together we have created something that neither side could have achieved alone: a truly reliable, supportive and accessible tool for researchers worldwide. This is the kind of platform that creates and shapes new markets.”
The NX1 is designed for both performance and everyday usability. It supports standard silicon cantilevers as well as an optional qPlus sensor (quartz tuning fork) that enables picometer-range vibration amplitudes and high sensitivity to close-range forces. Probe changes are simplified by a pre-aligned kinematic chip carrier system, and an integrated on-axis optical microscope provides a direct view of the probe and sample throughout operation. The system is fully compatible with Park Systems’ SmartScan™ operating software and SmartAnalysis™ image analysis platform.
““Orpheus II proved the concept, but it was a research tool – for experts only,” says Prof. Franz J. Giessibl, University of Regensburg. “Park Systems’ expertise was essential to making this a reliable product that the broader research community can use. The NX1 embodies exactly what this idea always had the potential to be.”
The NX1 can be ordered now. Technical specifications and application data can be found at https://www.parksystems.com/en/products/research-afm/small-sample-afm/nx1.
INFORMATION ABOUT PARK SYSTEMS
Park Systems is a global leader in nanometrology, providing advanced measurement solutions for research and industrial applications. With regional offices in North and South America, Europe and Asia, the company supports customers in semiconductor manufacturing, materials science and nanotechnology research.
Park Systems’ technology portfolio includes atomic force microscopy (AFM), imaging spectroscopic ellipsometry, digital holographic microscopy, white light interferometry and active vibration isolation systems.
The company was founded by Dr. Sang-il Park, a co-developer of AFM at Stanford University, and has become a leading force in the global nanometrology industry through continued innovation and strategic acquisitions, including Accurion GmbH and Lyncée Tec SA.
For more information, visit www.parksystems.com
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