/PRNewswire/ — Park Systems Corp., a global leader in atomic force microscopy (AFM) solutions, today announced the launch of the NX1, a compact and powerful AFM that delivers atomic resolution imaging under ambient conditions. Developed in collaboration with Professor Franz J. Giessibl of the University of Regensburg, one of the world’s leading authorities on atomic resolution AFM, the NX1 brings within reach of research laboratories around the world a class of imaging performance previously confined to ultra-high vacuum environments.
(Left to right) Prof. Franz J. Giessibl (University of Regensburg) and Dr. Sang-il Park (Founder & CEO, Park Systems)
The Park NX1 Atomic Force Microscope, designed for atomic-scale imaging in ambient conditions.
The NX1 is based on Orpheus II, a prototype developed by Professor Giessibl’s group in Regensburg that demonstrated that atomic resolution imaging under ambient conditions was feasible. Park Systems has brought this concept to fruition into a successful commercial product, combining the proven architecture of the Orpheus II – including its Kovar housing for exceptional thermal stability – with Park Systems’ precision manufacturing, product reliability and international AFM engineering expertise. The result is an instrument with an order of magnitude lower noise floor than conventional AFM systems, making atomic-scale imaging accessible in everyday laboratories.
« The NX1 is the result of combining Professor Giessibl’s pioneering research and Park Systems’ proven ability to bring the world’s most advanced science to market,” said Dr. Sang–Joon Cho, executive vice president and head of the research equipment division at Park Systems. “Together, we have created something that neither party could have achieved alone: a truly reliable tool that is easy to use and accessible to researchers around the world. This is the kind of platform that creates and shapes new markets. »
Designed for both peak performance and everyday use, the NX1 is compatible with standard silicon cantilevers as well as an optional qPlus (quartz tuning fork) sensor, providing picometer-level oscillation amplitudes and high sensitivity to short-range forces. Probe changing is simplified with a pre-aligned kinematic chip holder system, and an integrated on-axis optical microscope allows direct visualization of the probe and sample throughout the operation. The system is fully compatible with Park Systems’ SmartScan™ operating software and SmartAnalysis™ image analysis platform.
« Orpheus II proved the concept, but it was a research instrument – for experts only,” said Professor Franz J. Giessibl of the University of Regensburg. “Park Systems’ expertise was essential in making it a reliable product that can be used by the entire scientific community. The NX1 is what the idea always had the potential to become. »
The NX1 is now available to order. For technical specifications and application data, see https://www.parksystems.com/en/products/research-afm/small-sample-afm/nx1.
ABOUT PARK SYSTEMS
Park Systems is a global leader in the field of nanometrology, providing advanced measurement solutions for research and industrial applications. With regional offices in America, Europe and Asia, the company supports customers in semiconductor manufacturing, materials science and nanotechnology research.
Its technology portfolio includes atomic force microscopy (AFM), imaging spectroscopic ellipsometry, digital holographic microscopy, white light interferometry and active vibration isolation systems.
Founded by Dr. Sang-il Park, who helped invent AFM at Stanford University, the company has grown through continued innovation and strategic acquisitions, including Accurion GmbH and Lyncée Tec SA, to become a leader in the global nanometrology industry.
For more information, visit www.parksystems.com
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