-Park Systems launches NX1: The highest resolution atomic force microscope for atomic scale imaging under ambient conditions
/PRNewswire/ — Park Systems Corp., a leading global provider of atomic force microscopy (AFM) solutions, today announced the launch of the NX1, a compact, high-performance atomic force microscope that delivers atomic resolution imaging under ambient conditions. Developed in collaboration with Professor Franz J. Giessibl of the University of Regensburg, one of the world’s leading authorities on atomic resolution AFM, the NX1 brings a level of imaging performance previously only possible in ultra-high vacuum environments to the reach of research laboratories around the world.
(Left to right) Prof. Franz J. Giessibl (University of Regensburg) and Dr. Sang-il Park (Founder & CEO, Park Systems)
The Park NX1 Atomic Force Microscope, designed for atomic-scale imaging in ambient conditions.
The NX1 is based on Orpheus II, a prototype developed by Professor Giessibl’s group in Regensburg that demonstrated the possibility of imaging with atomic resolution under ambient conditions. Park Systems transformed this concept into a fully developed commercial product, combining Orpheus II’s proven core architecture, including a Kovar body for exceptional thermal stability, with Park Systems’ precision manufacturing, product reliability and global AFM engineering expertise. The result is an instrument that achieves a noise level approximately one order of magnitude lower than conventional AFM systems, making atomic-scale imaging accessible in everyday laboratory environments.
“The NX1 is the result of combining Professor Giessibl’s pioneering research with Park Systems’ proven ability to bring the world’s most advanced science to market.“stated Dr. Sang Joon Cho, Executive Vice President and Head of Research Equipment Business Unit at Park Systems.”Together, we have created something that neither party could have achieved alone: a truly reliable instrument, technically supported and accessible to researchers around the world. “This is the kind of platform that creates and shapes new markets.”
Designed for performance and everyday usability, the NX1 supports standard silicon cantilevers as well as an optional qPlus (quartz tuning fork) sensor, enabling picometer-scale oscillation amplitudes and high sensitivity to short-range forces. Probe change is simplified by a pre-aligned kinematic chip holder system, and an on-axis optical microscope provides a direct view of the probe and sample throughout operation. The system is fully compatible with Park Systems’ SmartScan™ operating software and SmartAnalysis™ image analysis platform.
“Orpheus II demonstrated the viability of the concept, but it was a research instrument, only for experts“said Professor Franz J. Giessibl of the University of Regensburg. “Park Systems’ expertise was instrumental in making it a reliable product that the broader research community could use. The NX1 is what this idea always had the potential to be.”
The NX1 is now available for order. For technical specifications and application data, please visit https://www.parksystems.com/en/products/research-afm/small-sample-afm/nx1.
ABOUT PARK SYSTEMS
Park Systems is a world leader in nanometrology, providing advanced measurement solutions for research and industrial applications. With regional offices in the Americas, Europe and Asia, the company supports clients in semiconductor manufacturing, materials science and nanotechnology research.
Park Systems’ technology portfolio includes atomic force microscopy (AFM), spectroscopic imaging ellipsometry, digital holographic microscopy, white light interferometry and active vibration isolation systems.
Founded by Dr. Sang-il Park, who contributed to the invention of AFM at Stanford University, the company has grown through continuous innovation and strategic acquisitions, such as Accurion GmbH and Lyncée Tec SA, to become a leader in the global nanometrology industry.
For more information, visit www.parksystems.com
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